The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 1994
Filed:
Dec. 03, 1992
Ronald A Banike, Orland Park, IL (US);
R. R. Donnelley & Sons Co., Lisle, IL (US);
Abstract
In order to achieve relative simplicity in a reliable measurement technique, an apparatus and method for measuring wet film thickness on a surface is disclosed. The apparatus includes a fixture adapted to be positioned in close proximity to the surface, a gauge supported by the fixture for movement toward and away from the surface, and a spacer for spacing the fixture at a selected distance from the surface. The gauge is moveable from a first position out of contact with the wet film to a second position in contact with the surface to create a measurable spot of the wet film on the gauge. The method includes providing a gauge supported for movement toward and away from the surface, moving the gauge into contact with the surface to create a measurable wet film spot, and moving the gauge out of contact with the wet film to measure the spot. When this has been achieved, the method includes the further step of taking a measurement of the wet film spot and converting the measurement to a wet film thickness, preferably by utilizing a calibration graph that has been created by utilizing a test plate having a tapered channel of known depth.