The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 05, 1994

Filed:

Aug. 28, 1991
Applicant:
Inventor:

Fumihiro Hatayama, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
395133 ;
Abstract

For image parts in an image with large circumscribed quadrilaterals, one-dimensional data development is executed where intersection point data on a scanning line are accumulated for plural image parts and one-dimensional raster data of the scanning line is produced based on the intersection point data. For image parts with small circumscribed quadrilaterals, two-dimensional data development is executed where intersection point data in an image part are obtained and two-dimensional raster data of the image part is produced. While the one-dimensional data development requires only a small memory capacity for raster data creation even for relatively large image parts, the two-dimensional data development allows high-speed raster data creation for relatively small image parts.


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