The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 05, 1994

Filed:

Jan. 02, 1991
Applicant:
Inventors:

Sigekazu Togashi, Katano, JP;

Kunio Suesada, Ikoma, JP;

Kunio Sekimoto, Katano, JP;

Yoshinobu Oba, Atsugi, JP;

Tadashi Nakayama, Machida, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B / ; G11B / ; G11B / ;
U.S. Cl.
CPC ...
360 13 ; 360 64 ; 360 66 ;
Abstract

A recording apparatus of the present invention includes selective guard adding means for predicting, at the time of editing, positions of adjacency of new tracks to previously recorded tracks obtained at the time of completion of new track recording, and adds, at the time of editing, guards to locations where disturbance due to residue of erasing of the same azimuth might occur in order to remove or reduce the disturbance due to residue of erasing of the same azimuth caused at the editing point. When performing reproduction from a recording medium whereon tracks recorded by heads of at least two kinds of azimuth angles are disposed alternately and a plurality of tracks are handled as one recording unit and recorded, a reproducing apparatus of the present invention is so configured that the center of each of heads located at both ends of reproducing heads may be shifted to the inside as compared with each corresponding recording track. When disturbance due to the residue of erasing of the same azimuth occurs at the editing point, therefore, more signals of tracks to be originally reproduced can be reproduced, resulting in a greater resistance to disturbance of the same azimuth.


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