The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 05, 1994
Filed:
Jun. 21, 1993
Applicant:
Inventors:
Assignee:
Kanai School, Inc., Fukui, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356353 ; 356355 ; 356357 ; 356385 ; 356335 ;
Abstract
An apparatus is described for measuring the size of a particulate, without contacting the particulate, and therefore without extra forces on the particulate. Stripped gaps of interference fringes are measured behind the particulate when a monochromatic beam is radiated on the particulate.
Kanai, Kenzo. (1994). Apparatus for measuring particulate size without contacting the (U.S. Patent No. 5327217). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5327217
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile