The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 05, 1994
Filed:
Mar. 19, 1992
Applicant:
Inventors:
Layton D Crytzer, Natrona Heights, PA (US);
Leroy R Balmer, Saxonburg, PA (US);
Assignee:
Allegheny Ludlum Corporation, Pittsburgh, PA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01R / ;
U.S. Cl.
CPC ...
324239 ; 324262 ;
Abstract
The grain structure of electrical steel strip is tested by inducing a magnetic flux field into the strip by pole pieces at opposite sides of a permanent magnet. A magnetic detector head between the pole pieces responds to the leakage of flux as the steel strip and/or magnetic detection undergoes relative movement. A recorder is used to identify banding and mixed grain structures which cause a smaller flux leakage amplitude than larger desired grains.
Crytzer, Layton. (1994). Method and apparatus using magnetic flux scanning to test grain (U.S. Patent No. 5327083). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5327083
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile