The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 05, 1994

Filed:

Dec. 30, 1992
Applicant:
Inventors:

Taeho Kook, Lower Macungie Township, Lehigh County, PA (US);

Avinoam Kornblit, Highland Park, NJ (US);

Kolawole R Olasupo, Kutztown, PA (US);

Assignee:

AT&T Bell Laboratories, Murray Hill, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L / ;
U.S. Cl.
CPC ...
437229 ; 437228 ; 156643 ; 156657 ; 1566591 ; 1566611 ;
Abstract

Pattern transfer from a resist to an underlying layer is accomplished by etching the underlying layer in a plasma comprising hydrogen bromide and oxygen. Accuracy of pattern transfer is obtained by using first and second materials underneath the resist. The first and second materials may be, e.g., polysilicon and a photoresist. Etching of the resist is performed under conditions designed to minimize changes in the horizontal dimensions.


Find Patent Forward Citations

Quick Actions:

Kook, Taeho. (1994). Method for integrated circuit fabrication including linewidth control (U.S. Patent No. 5326727). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5326727

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…