The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 28, 1994

Filed:

Oct. 29, 1992
Applicant:
Inventors:

Wilhelmus J Habraken, Eindhoven, NL;

Johannes G Van Endschot, Eindhoven, NL;

Assignee:

U.S. Philips Corporation, New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03B / ;
U.S. Cl.
CPC ...
378181 ; 378197 ;
Abstract

In an x-ray examination apparatus, a film holder is mounted on a frame, which itself is connected to the carrier, notably a C-arm, for the x-ray source and the image intensifier. When not in use, the film holder can be placed in a park position against the inner circumference of the C-arm, such that the film holder neither obscures, nor impedes access to the patient (region). The frame with the film holder can be rotated to a standby position next to the image intensifier, such that the film holder can be conveniently reached for preparation for exposure. Finally, the film holder can be rotated with respect to the frame into an exposure position in front of the image intensifier. The C-arm remains balanced for all three positions of the film holder; this is achieved by two counterweights that move along the outer circumference of the C-arm, just under its outer enclosure. Consequently, the C-arm can be moved manually without considerable effort. Because in its park position the film holder does not protrude beyond the outer circumference of the C-arm, the motion of the C-arm is not restricted by the film holder.


Find Patent Forward Citations

Habraken, Wilhelmus. (1994). X-ray examination apparatus (U.S. Patent No. 5325413). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5325413

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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