The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 28, 1994
Filed:
Apr. 03, 1992
Bernard Louis, Liancourt, FR;
Bernard Bichot, Clermont, FR;
Isover Saint-Gobain, Courbevoie, FR;
Abstract
An optical method continuously monitors the dimensions of a body having a parallelogram cross-section and supported on a moving conveyor. A first angular measurement of a first dimension of a first face of the body in a first direction is first performed, the first angular measurement being made with respect to a first reference angle at an apex of a first triangular plane having the first dimension as one side thereof. Substantially simultaneously with the step of determining the first angular measurement, a second angular measurement of a second dimension of a second face of the body in a second direction perpendicular to the first direction is determined, the second face intersecting the first face and the second angular measurement being made with respect to a second reference angle at an apex of a second triangular plane coplanar with the first triangular plane and having a second dimension as one side thereof. The first and second dimensions thus have a common point at a line of intersection of the first and second faces. The position of the common point with respect to one of the first and second directions is then estimated and an iterative process is used to determine the position of the common point. The iterative process is continued until the position of the common point is determined to within a required accuracy in both of the first and second directions.