The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 28, 1994

Filed:

Dec. 10, 1992
Applicant:
Inventors:

Paul M Ingram, Jr, Mesquite, TX (US);

James R Johnson, Plano, TX (US);

Fenton L Givens, Dallas, TX (US);

Assignee:

E-Systems, Inc., Dallas, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J / ; G01W / ;
U.S. Cl.
CPC ...
374124 ; 374109 ; 364420 ;
Abstract

A method of estimating both atmospheric conditions and surface temperatures of an object from either a single set of multispectral images or multiple simultaneously-acquired single-band images of the object. Estimates of atmospheric conditions are generated by determining and radiometrically correcting radiance values measured from the image of the object. Expected radiance values are then determined and compared with the measured radiance values. The best fit of the radiance values measured from the image of the object to the expected radiance values corresponds to the best estimate of the atmospheric conditions associated with the object. The present method estimates atmospheric conditions for the object regardless of the availability of atmospheric conditions associated with the image.


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