The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 21, 1994
Filed:
Jan. 23, 1992
Robert E Marker, III, Loveland, CO (US);
Darrell B Johnsrud, Loveland, CO (US);
Hewlett-Packard Company, Palo Alto, CA (US);
Abstract
A method for generating a functional test for a loaded printed circuit board automatically generates a test for a cluster of elements which may be tested together as a functional unit by pattern matching with pre-defined cluster models contained in a library. The method includes the following steps. First, an electrical description of the printed circuit board is analyzed to identify any clusters of elements which match any pre-defined cluster models. When a match is found, a generic test routine is retrieved from the model and used to generate a functional test for the cluster of elements on the printed circuit board. Thereafter, tests are generated for remaining, non-clustered devices by matching each device to a generic model within a device models library, and then retrieving a generic test routine therefrom.