The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 21, 1994

Filed:

Feb. 07, 1992
Applicant:
Inventors:

Miles N Wernick, Chicago, IL (US);

Chin-Tu Chen, Lisle, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T / ;
U.S. Cl.
CPC ...
25036303 ; 36441315 ; 378-4 ; 25036307 ;
Abstract

A method and system for improving signal recovery for tomographic-type detection systems is disclosed which reduces the effect of blurring by obtaining a spatial response function for a plurality of selected detectors and moving the detectors to various positions at various times such that at least two tomographic measurements are taken of substantially the same signal when the object and detection means are at different relative positions. The measurements are then represented as a set of linear equations wherein elements of the response function become weighting factors for corresponding unknown tomographic signal elements. The unknown tomographic signal elements are then estimated by solving the set of linear equations. The tomographic signal elements may then be used as data in projection profiles to generate projection matrices or images directly.


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