The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 1994
Filed:
Dec. 27, 1991
Applicant:
Inventors:
Quang H Nguyen, San Jose, CA (US);
Glenn Grant, Saratoga, CA (US);
Duncan Penman, Sunnyvale, CA (US);
Allan Zymslowski, Sunnyvale, CA (US);
Armand Minnie, Salinas, CA (US);
Assignee:
Amdahl Corporation, Sunnyvale, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
371 12 ; 371-7 ;
Abstract
The invention provides a method and apparatus for localizing error recovery activities to specific ones of logically parallel processes ongoing within a computer and to the initiators of error-infected ones of such processes.
Nguyen, Quang. (1994). Method and apparatus for providing retry coverage in multi-process (U.S. Patent No. 5321698). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5321698
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile