The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 14, 1994

Filed:

Mar. 23, 1992
Applicant:
Inventors:

Timothy F Donahue, Farmington, NY (US);

James W Fulmer, Canandaigua, NY (US);

Assignee:

Eastman Kodak Company, Rochester, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J / ; H04N / ;
U.S. Cl.
CPC ...
356218 ; 348191 ;
Abstract

A subtractive measurement technique in which a CRT display light intensity output is biased above a noise range of a low cost sensor by turning on one or more electron beam guns to produce light levels above the noise range. A bias value is measured. Electron beam guns for colors other than the color being measured are turned on. The gun for the color to be measured is then incremented through its operating range and measured light intensity values at each step are obtained using the sensor. The bias value is subtracted from the measured values to obtain the actual light intensity values for the color primary control value to luminance transfer curve being characterized.


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