The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 1994
Filed:
Mar. 23, 1993
Rintaro Nakane, Yokohama, JP;
Jiro Egawa, Yokosuka, JP;
Kabushiki Kaisha Toshiba, Kawasaki, JP;
Abstract
In an image forming apparatus of the present invention, the adhesion amounts of developing agent on a high-density test pattern and a low-density test pattern are measured by a toner density measuring unit. On the basis of the measured adhesion amounts of developing agent on the high-density region and low-density region and the target values of the adhesion amounts, deviations of the adhesion amounts of the high-density region and the low density region are calculated. The renewal amount of contrast voltage and the renewal amount of background voltage corresponding to the high-density region deviation and low-density region deviation are inferred by an inference unit on the basis of inference data stored in a memory unit. The grid bias value and development bias value corresponding to the inferred renewal amounts of contrast voltage and background voltage are calculated. The grid bias voltage and development bias voltage are varied in accordance with the calculated grid bias value and development bias value.