The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 14, 1994

Filed:

Jan. 08, 1993
Applicant:
Inventors:

Hideki Wakamatsu, Kobeshi, JP;

Nobuo Nakata, Kobeshi, JP;

Yohichi Kuboyama, Kobeshi, JP;

Hideshi Tanaka, Kobeshi, JP;

Assignee:

Hewlett-Packard Company, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324523 ; 3241 / ; 324540 ;
Abstract

A two-terminal circuit element measuring apparatus of the present invention is capable of distinguishing a loose connection between a DUT and the measuring apparatus from a high impedance in the DUT. The measuring apparatus is also capable of measuring the impedance of the DUT without altering the connections between the DUT and the measuring apparatus. The measuring apparatus applies both DC and AC current signals to the DUT so as to compensate any leakage current occurring within the three-wire cable connecting the DUT and the measuring apparatus. Because of the compensation, when both DC and AC current ammeters indicate substantially zero values, it is assured that a loose connection exists.


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