The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 14, 1994

Filed:

Sep. 10, 1992
Applicant:
Inventor:

Robert J Valenta, West Chicago, IL (US);

Assignee:

Packard Instrument Company, Inc., Downers Grove, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
2502521 ; 250328 ; 2503 / ;
Abstract

A normalization system for multi-photodetector single photon counting luminescent measuring systems and a standard for use in the same. The method comprises calculating one or more counting ratios for each photodetector in the single photon counting system and multiplying counts of unknown samples by the inverse of the appropriate counting ratio. A counting ratio for a particular photodetector is calculated by dividing the count of a standard measured by the photodetector by the count of the same standard measured by a reference photodetector. The particular standard developed employs calcium tungstate:lead as a scintillator and tritium or carbon-14 thymidine as a means of exciting the scintillator. This standard has the advantages of providing a good model of typical luminescence chemistry and producing an emission pattern which is susceptible to single photon counting.


Find Patent Forward Citations

Valenta, Robert. (1994). Normalization technique for photon-counting luminometer (U.S. Patent No. 5321261). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5321261

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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