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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 5320734 B1

PDFFull Text
Date of Patent:
Jun. 14, 1994

Filed:

Oct. 29, 1992

Test apparatus for measuring concentration of test substance in liquid

Applicant:
Inventors:

Koichi Yamasaki, Oumihachiman, JP;

Tatsuhiko Osaka, Kurita, JP;

Hitonaga Nakano, Kouga, JP;

Toji Mukai, Yasu, JP;

Yasuhiro Nagata, deceased, late of Kusatsu, JP;

Sadaaki Nakaoka, Osaka, JP;

Susumu Fujita, Kobe, JP;

Yoichi Hamada, Kobe, JP;

Assignee:

Daikin Industries, Ltd., Osaka, JP;

Attorney:

Beveridge, DeGrandi, Weilacher & Young

Primary Examiner:

T Tung

Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
204415 ; 20415317 ; 204279 ;
Abstract

A test apparatus for measuring concentration of test solution, in which a thin sheet having a plurality of through holes and diffusion-limiting membranes to cover corresponding through hole, is movably installed, and one or two openings for deposition and a concentration measuring section are disposed in a thin sheet moving direction.

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Yamasaki, Koichi. (1994). Test apparatus for measuring concentration of test substance in liquid (U.S. Patent No. 5320734). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5320734

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