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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 5319723 B1

PDFFull Text
Date of Patent:
Jun. 07, 1994

Filed:

Jun. 12, 1991

Method of processing pattern data on the basis of ranked amplitude

Applicant:
Inventors:

Johannes A Bernsen, Eindhoven, NL;

Geert Nijholt, Eindhoven, NL;

Eric H Persoon, Eindhoven, NL;

Assignee:

U.S. Philips Corporation, New York, NY (US);

Attorneys:

Marion; Michael E.

Weiss; Richard A.

Primary Examiner:

Yon J Couso

Int. Cl.
CPC ...
G06K / ; G06K / ; G06K / ;
U.S. Cl.
CPC ...
382 48 ; 382 30 ; 382 31 ; 382 41 ; 382 33 ;
Abstract

Method and apparatus for determining the presence of a predetermined pattern in a spatial field. The invention involves selecting a collection of amplitude values on the basis of location within a multivalued-amplitude field and arranging sequences of amplitude values in order of their magnitude. Amplitude values occurring at predetermined ranks are chosen as characteristic quantities representative of the portion of the field under consideration. By inter-relating a plurality of these characteristic quantities, pattern recognition is accomplished. Preferably rank value filters are employed for producing the characteristic quantities.

Find Patent Forward Citations

Bernsen, Johannes. (1994). Method of processing pattern data on the basis of ranked amplitude (U.S. Patent No. 5319723). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5319723

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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