The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 07, 1994
Filed:
Jul. 11, 1990
Applicant:
Inventors:
Toshinori Hosokawa, Daito, JP;
Akira Motohara, Kobe, JP;
Assignee:
Matsushita Electric Industrial Co., Ltd., Osaka, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
371 27 ; 371 223 ; 371 151 ;
Abstract
An apparatus for and method of performing automatic test pattern generation for a digital circuit specified registers when the process of automatic test pattern generation for one or more faults is aborted which allow detection of circuit faults by scanning the specified registers. The scan request count of the specified registers is updated, and registers having a scan request count greater than the scan request count limit are recognized as critical registers. Automatic test pattern generation is performed while regarding the critical registers as scan registers.