The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 07, 1994

Filed:

Sep. 18, 1991
Applicant:
Inventors:

David L Simpson, West Columbia, SC (US);

Wilson E Smoak, III, West Columbia, SC (US);

Assignee:

NCR Corporation, Dayton, OH (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B / ;
U.S. Cl.
CPC ...
371 223 ; 371 221 ; 371 225 ;
Abstract

A boundary-scan output cell which includes critical data term and non-critical masking term paths without adding an extra layer of logic. The boundary-scan cell includes a multiplexer, a critical data path which transmits critical data terms, coupled to a first multiplexer input, a sampling circuit which transmits non-critical terms, term circuit coupled to a second multiplexer input, and a non-critical term path which transmits non-critical masking terms, coupled to the shift input of the multiplexer. Non-critical masking terms at the shift input are mimicked at the second input. Provision is also made for a test control circuit and a circuit for monitoring critical and non-critical terms.


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