The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 07, 1994

Filed:

Aug. 26, 1991
Applicant:
Inventors:

Minoru Ozaki, Amagasaki, JP;

Kyosuke Yoshimoto, Amagasaki, JP;

Hiroyuki Onda, Hoya, JP;

Koji Yamana, Setagaya Ward, JP;

Takuya Nagata, Hoya, JP;

Hidehiko Murata, Niiza, JP;

Yutaka Kobayashi, Musashino, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B / ;
U.S. Cl.
CPC ...
369 54 ; 369 58 ; 369 47 ; 369 48 ;
Abstract

A method for rewriting four defect management areas on an optical disk according to an ECMA standard is performed by means of deleting an old data which has been recorded on the respective defect management areas and then sequentially writing down a new data on respective defect management areas.


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