The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 07, 1994

Filed:

May. 27, 1992
Applicant:
Inventor:

Francis G Shinskey, Foxboro, MA (US);

Assignee:

The Foxboro Company, Foxboro, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B / ; G05B / ;
U.S. Cl.
CPC ...
364157 ; 364162 ;
Abstract

An improved system for tuning process control equipment applies a load change of amplitude .delta.q to the process to effect a change in it and, therefore, in the controlled variable. Monitoring the response of the controller to that change, the system identifies an observed overshoot, OVS.sub.o, in the manipulated variable signal. From that overshoot signal and a predetermined theoretical overshoot signal, OVS.sub..tau., the system generates an optimum gain, K.sub.opt, as a function of the mathematical expression K.sub.opt =K*(1+OVS.sub..tau.)/(1+OVS.sub.o), where K is the current gain of the automatic control subsection, OVS.sub.o is the observed overshoot, and OVS.sub..tau. is the predetermined overshoot.


Find Patent Forward Citations

Shinskey, Francis. (1994). Method and apparatus for generating an optimal gain of process control (U.S. Patent No. 5319539). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5319539

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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