The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 07, 1994
Filed:
Sep. 01, 1993
Mitsugu Terada, Sodegaura, JP;
Ken Ohmata, Sodegaura, JP;
Michito Uehara, Sodegaura, JP;
Hideaki Shibata, Sodegaura, JP;
Yasuo Oeda, Sodegaura, JP;
Yuichiro Terashi, Sodegaura, JP;
Mitsui Petrochemical Industries, Ltd., Tokyo, JP;
Abstract
A laser light, whose wavelength is to be measured, is introduced into an etalon, a concentric circular interference stripe derived from the etalon is irradiated onto a one-dimensional photodetector array and a diameter of the interference stripe is measured to measure the wavelength of the laser light. Alternatively, if a reference laser light of known wavelength is introduced into the etalon, as described above, a wavelength measurement of extremely high accuracy can be made without being affected by positional deviations of the optical system.