The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 07, 1994
Filed:
Sep. 04, 1991
Applicant:
Inventors:
Serge M Melle, Toronto, Ontario, CA;
Kexing Liu, Toronto, Ontario, CA;
Raymond M Measures, Thornhill, Ontario, CA;
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356 32 ; 25022718 ;
Abstract
A method and apparatus for measuring the wavelength of spectrally narrow optical signals, particularly from guidedwave structures, is taught, which utilizes a known wavelength dependent transfer function and determining from the resulting signal the wavelength. In a preferred embodiment the spectrally narrow optical signal is divided into at least two signals, followed by optically processing the signals to produce a wavelength dependent change between the signals and determining the wavelength therefrom.