The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 07, 1994

Filed:

Jun. 01, 1993
Applicant:
Inventors:

Eugene W Chase, Middletown, NJ (US);

Francis DeRosa, Middletown, NJ (US);

Michael P Dugan, Toms River, NJ (US);

Burton A Unger, Monmouth Beach, NJ (US);

Assignee:

Bell Communications Research, Inc., Livingston, NJ (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ; G01N / ; G01N / ;
U.S. Cl.
CPC ...
374 57 ; 62-33 ; 738656 ;
Abstract

An environmental testing chamber (10) and thermal cycling method in which, in addition to stressing the device (20) under test with electrical bias (32), elevated temperature (12), pressure (16), and humidity (18) while the device is being monitored (32), a thermoelectric heat pump (26) quickly cycles the temperature of the device by pumping heat from the heat sink (22) mounting the device to another larger heat sink (24).


Find Patent Forward Citations

Chase, Eugene. (1994). Rapid temperature cycling for accelerated stress testing (U.S. Patent No. 5318361). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5318361

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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