The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 31, 1994
Filed:
May. 30, 1990
Eric B Hochberg, Altadena, CA (US);
Edmund C Baroth, Granada Hills, CA (US);
California Institute of Technology, Pasadena, CA (US);
Abstract
An novel interferometric apparatus and method for measuring the topography of aspheric surfaces, without requiring any form of scanning or phase shifting. The apparatus and method of the present invention utilize a white-light interferometer, such as a white-light Twyman-Green interferometer, combined with a means for dispersing a polychromatic interference pattern, using a fiber-optic bundle and a disperser such as a prism for determining the monochromatic spectral intensities of the polychromatic interference pattern which intensities uniquely define the optical path differences or OPD between the surface under test and a reference surface such as a reference sphere. Consequently, the present invention comprises a 'snapshot' approach to measuring aspheric surface topographies such as the human cornea, thereby obviating vibration sensitive scanning which would otherwise reduce the accuracy of the measurement. The invention utilizes a polychromatic interference pattern in the pupil image plane, which is dispersed on a point-wise basis, by using a special area-to-line fiber-optic manifold, onto a CCD or other type detector comprising a plurality of columns of pixels. Each such column is dedicated to a single point of the fringe pattern for enabling determination of the spectral content of the pattern. The auto-correlation of the dispersed spectrum of the fringe pattern is uniquely characteristic of a particular optical path difference between the surface under test and a reference surface.