The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 31, 1994
Filed:
Apr. 14, 1992
Applicant:
Inventor:
James N Macri, Oyster Bay, NY (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
436 87 ; 435-79 ; 435-792 ; 436 65 ; 436 86 ; 436510 ; 436518 ; 436548 ;
Abstract
A screening method for fetal Down syndrome using free beta (HCG) as a marker. The maternal blood level of free beta (HCG) is measured and compared to reference data, at a similar gestational age, of the level of free beta (HCG) in pregnant women carrying a fetus with Down syndrome and pregnant women carrying an unaffected fetus. The method may advantageously be utilized during the first and second trimesters of pregnancy. Fragments of free beta and 'nicked' free beta may also be utilized as markers.
Macri, James. (1994). Screening method for detecting fetal chromosal abnormalities (U.S. Patent No. 5316953). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5316953
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile