The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 31, 1994

Filed:

Sep. 27, 1991
Applicant:
Inventors:

Osamu Sugimoto, Iruma, JP;

Yonezo Furuya, Hatoyama, JP;

Ichiro Fukuda, Kawagoe, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G07D / ;
U.S. Cl.
CPC ...
194318 ;
Abstract

There is provided a method and apparatus for discriminating between true and false coins wherein a coin satisfying both the electrical success conditions at their lowest levels is regarded as a false coin, and a coin satisfying at least one of the two electrical success conditions at a high level is regarded as a true coin. According to the method discriminating apparatus is mounted relative to a predetermined passage along which a coin or the like to be discriminated passes, wherein true/false discrimination is carried out in accordance with whether or not the two or three different data detected from the coin and developed on a two- or three-dimensional coordinate system falls within a predetermined two- or three-dimensional function closed area. The apparatus includes: a coin passage along which a coin to be discriminated passes; exciting units mounted relative to the coin passage for exciting the coin passing along the coin passage; detecting units for detecting the state of the coin excited by the exciting units; and a unit for discriminating the coin between true and false in accordance with whether or not the data detected by the detecting units falls within a predetermined two or three-dimensional function closed area on a predetermined two or three-dimensional coordinate system.


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