The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 24, 1994
Filed:
Apr. 28, 1993
Matsushita Electric Industrial Co., Ltd., Osaka, JP;
Abstract
An apparatus for measuring the double refractive phase difference of an orientation film formed on an electrode substrate is disclosed. The apparatus provided with a laser generating two linearly polarized beams having optical electric fields perpendicular to each other and to the direction of the propagation, beam splitter for splitting the light transmitted through the substrate into two, detectors for detecting a component of 45.degree. to the x-y plane included in one of the two splitted lights and a component in the x or y direction included in the other splitted light and calculation circuit for calculating the double refractive phase difference of an orientation film based on detected values of these two components. The rubbing conditions are controlled in accordance with the double refractive phase difference measured.