The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 24, 1994
Filed:
Apr. 03, 1992
Applicant:
Inventors:
Ulrich Kaczynski, Bad Nauheim, DE;
Roland Hedrich, Ehringshausen, DE;
Assignee:
Leica Mikroskopie und Systems GmbH, Wetzlar, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01H / ; G01N / ;
U.S. Cl.
CPC ...
200 47 ; 2003321 ; 359392 ;
Abstract
A limit switching apparatus with defined overtravel for specimen-objective protection on microscopes having a motorized focusing drive. A stored focus position or position of the specimen stage can be overtraveled by a fixed amount. The maximum travel path of the specimen stage is additionally limited by a switching rod and a short-circuiting switch, in order to ensure reliable specimen-objective protection even in the event of a fault in the control electronics.