The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 17, 1994

Filed:

Mar. 20, 1992
Applicant:
Inventors:

Yoshihiro Uchida, Kawasaki, JP;

Satoshi Kakuma, Kawasaki, JP;

Naoyuki Izawa, Kawasaki, JP;

Yasuhiro Aso, Kawasaki, JP;

Shuji Yoshimura, Kawasaki, JP;

Masami Murayama, Kawasaki, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L / ; H04Q / ; H04J / ;
U.S. Cl.
CPC ...
370 13 ; 370 15 ; 370 60 ; 370 941 ;
Abstract

A first form of an ATM channel testing apparatus tests an ATM channel by having a test cell detector in each switch to detect whether or not the switch appropriately switches a test cell generated by a test cell generating trunk. A second form of an ATM channel testing apparatus easily tests an ATM channel by having test cell generators provided for the respective input highways sequentially generating test cells including test cell identifying information and input highway identifying information, and having test cell checkers provided respectively for the output highways simply tally the test cells by the respective input highways. A third form of an ATM channel testing apparatus tests an ATM channel with less pieces of hardware by having turnaround parts in respective ordinary trunks sequentially turn around a test cell generated by a test cell generating trunk to be finally returned to the test cell generating trunk. A fourth form of an ATM channel testing apparatus tests an ATM channel by having a test cell checker provided for each of output highways to examine whether or not the test data carried in respective octets of the payloads in extracted test cells are of consecutive values.


Find Patent Forward Citations

Loading…