The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 17, 1994
Filed:
Dec. 28, 1992
Paul A Seib, Manhattan, KS (US);
Feng Guan, Manhattan, KS (US);
Kansas State University Research Foundation, Manhattan, KS (US);
Abstract
A testing apparatus (20) and a corresponding method are provided for validly measuring the stickiness or adhesiveness of a sample (52) such as cooked pasta. The apparatus (20) includes a support surface (42) on which the sample (52) is placed, an apertured restraining member (106) for preventing separation between the sample (52) and supporting surface (42), a probe (70) presenting a sample-engaging face (82) for engaging and disengaging a portion of the sample (52), and a tester (22) which is coupled to the probe (70) for moving the probe (70) into and out of engagement with the sample (52). A plurality of probes (70-80) may be provided each presenting a different sample-engaging surface (82) for selective and alternate engagement with the sample (52). The restraining member (106) may be mounted on the tester (22) for shiftable movement relative to the sample (52), and is resiliently biased toward the sample (52) for holding the latter firmly against the supporting surface (42). In use, an integrated negative-force region (212) of a force curve generated by the tester (22) is an accurate measure of stickiness of the sample (52).