The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 10, 1994
Filed:
Apr. 26, 1991
Klaus Freischlad, Aalen, DE;
Carl-Zeiss-Stiftung, Heidenheim, DE;
Abstract
Described are a method and apparatus for the optical testing of samples in which a camera records a plurality of images of an interferogram or a bar pattern. Phase values are determined for each image point of each camera record, and then differences between the phase values of adjacent points in each image line and column are computed in modulo 2.pi.. These differences for each image point are summed over the plurality of camera images. After a number of images sufficient to assure desired accuracy have been summed, a single discontinuity elimination is carried out. This permits the rapid averaging of measurements over the plurality of camera images in real video time and remarkably reduces the measuring time and statistical errors.