The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 10, 1994

Filed:

Apr. 23, 1992
Applicant:
Inventors:

Michael Mathews, Wiltshire, GB;

David G Rusling, Wiltshire, GB;

Michael J Stolc, Wiltshire, GB;

Robert I Barker, Akron, OH (US);

Assignee:

Monsanto Company, St. Louis, MO (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73846 ;
Abstract

A method of operating an instrument for testing the physical properties of materials in which each of a series of samples of the material to be tested is placed in a test position located between dies, the dies are closed to mould the material to a test shape, a test is carried out on the sample in the mould and after completion of the test the dies are opened and the sample is removed from the test position is characterised in that a film of material which is substantially non-adhesive to the dies under the conditions of the test is provided to cover those surfaces of the sample which, in the absence of the film, would be in contact with the dies, each sample in turn is conveyed to the test position, and mechanical elements are provided for removing each sample from the test position after the completion of the test. Apparatus suitable for use in the method of the invention is also provided.


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