The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 03, 1994

Filed:

Feb. 25, 1993
Applicant:
Inventor:

Yuichi Akanabe, Hino, JP;

Assignee:

Konica Corporation, Hino, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B / ;
U.S. Cl.
CPC ...
359209 ; 359210 ; 359211 ; 359219 ; 359201 ; 358491 ; 358493 ;
Abstract

An optical beam scanning apparatus of this invention includes rotary optical element rotating on an axis of rotation and guiding optical beams incident parallel to the axis of rotation to a direction rectangular to the axis of rotation so as to scan a cylindrical surface inside a cylinder by rotating the optical beams in a peripheral direction. An anamorphic optical system rotating on a straight line substantially coinciding with the axis of rotation, for example, is disposed as optical beam rotation element on the incident side of the optical beams of the rotary optical element, and the optical beams incident into the rotary optical element are rotated at the same rotating speed as that of the rotary optical element on the straight line as the axis of rotation. According to this structure, a plurality of optical beams do not corss one another on the cylindrical surface when they are used, but form substantially parallel beam lines. Accordingly, multiple beam scanning as well as high speed recording becomes possible.


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