The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 03, 1994
Filed:
Dec. 07, 1992
Takashi Nagano, Tokyo, JP;
Toru Takahashi, Tokyo, JP;
Olympus Optical Co., Ltd., Tokyo, JP;
Abstract
An apparatus for photographing an image of a sample observed through a microscope comprises a photometry region designating unit, an optical member for superimposing an image of an indicator light beam on an image of an object light beam, an area sensor, a reflecting member for reflecting the object light beam and the indicator light beam and guiding them to the area sensor, a photometry region determining unit, a photometry unit, and a photographing unit. The photometry region designating unit generates an indicator light beam which is movable in a plane perpendicular to the optical axis of the object light beam output from an objective lens. The photometry region determining unit stores a photometry signal supplied from the area sensor in correspondence with a position of a light receiving plane, detects the position of the light receiving plane, on which the indicator light is projected, by using the photometry signal, and determines a photometry region based on the detected position. The photometry unit measures the brightness of the photometry region determined by the photometry region determining unit and calculates a photometry value. The photographing unit photographs an image of the sample based on the photometry value.