The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 03, 1994

Filed:

Aug. 08, 1991
Applicant:
Inventors:

Yoshio Kawamura, Kokubunji, JP;

Yoshu Yoshiba, Ageo, JP;

Shinji Tanaka, Akishima, JP;

Kazuo Sato, Tokyo, JP;

Jiro Kikuchi, Yuki, JP;

Kahoru Takahashi, Katsuta, JP;

Assignees:

Hitachi, Ltd., Tokyo, JP;

Hitachi Koki Co., Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C12Q / ; C12N / ; C12M / ; C12M / ;
U.S. Cl.
CPC ...
435 29 ; 4352401 ; 4352402 ; 4352404 ; 435284 ; 435287 ; 435291 ; 435300 ; 435301 ; 935 89 ; 935 94 ; 935 98 ; 436 63 ; 436807 ; 436809 ;
Abstract

In determining the effectiveness of parameters on cells, after treatment of the cells with one or more selected parameters, the results of the treatment can be quickly determined by measuring the number n.sub.0 of cells having a predetermined cell form, subsequently mechanically stressing the cells for a sufficient period of time t to change the cell form substantially, thereafter again measuring the number n of cells having the predetermined cell form, and determining the cell viability .tau.defined by .tau.=t/1n(n.sub.0 /n).


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