The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 03, 1994

Filed:

Mar. 23, 1992
Applicant:
Inventors:

Tihiro Ohkawa, La Jolla, CA (US);

Robert L Miller, San Diego, CA (US);

Assignee:

General Atomics, San Diego, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C12Q / ; G01N / ;
U.S. Cl.
CPC ...
435-6 ; 436 94 ; 435 912 ;
Abstract

A method for simultaneously sequencing both strands of a target DNA is provided. The method involves 'shifting' one or both strands of the target DNA by addition or deletion of one or more nucleotides to one or both strands of the duplex to produce shifted DNA. Both strands of the shifted DNA duplex and the target DNA are sequenced and the sequences of the shifted and unshifted target DNA are compared. Since portions of the sequenced strands of the target and shifted DNA are identical, all or a portion of sequence of the target DNA can be determined.


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Ohkawa, Tihiro. (1994). Method for sequencing double-stranded dna (U.S. Patent No. 5308751). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5308751

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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