The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 1994
Filed:
Oct. 14, 1992
Michel Darboux, Grenoble, FR;
Rosolino Lionti, Seyssins, FR;
Commissariat a l'Energie Atomique, Paris, FR;
Abstract
The process consists of producing a first binary image (104) from descriptive data of an integrated circuit (or another type of object) to be inspected, the data being stored in a data base (102). Real images of characteristic elements of the integrated circuit to be inspected are then acquired (200) and processed so as to be applicable (300) to the binary image, as a function of their associated positions. A this obtained synthesis image is considered as a reference image with which are compared the images of the circuits to be inspected. This process is applicable to numerous types of industrially produced objects requiring a very precise inspection.