The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 1994
Filed:
Dec. 06, 1990
Applicant:
Inventor:
James D Hill, Mt. Airy, MD (US);
Assignee:
Tandem Scanning Corporation, Reston, VA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ; G02B / ;
U.S. Cl.
CPC ...
359368 ; 359235 ; 359236 ;
Abstract
An improved method and apparatus for easily and accurately aligning confocal tandem scanning reflected light microscopes having scanning disc hole diameters as small as 20 microns are described. The method involves the observation and analysis of Moire and other patterns of light occurring within the microscope, and using the apparatus to make very sensitive adjustments that result in a fully aligned, rugged, and stable confocal tandem scanning reflected light microscope offering improved resolution, contrast, and optical slicing capability.