The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 26, 1994

Filed:

Oct. 30, 1992
Applicant:
Inventors:

Thomas R Payne, Louisville, KY (US);

Steven A Rice, Louisville, KY (US);

Assignee:

General Electric Company, Louisville, KY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B / ;
U.S. Cl.
CPC ...
318561 ; 318671 ; 34082522 ; 3408253 ;
Abstract

A highly flexible electronic control system which is readily reconfigurable or reprogrammable to suit more than one machine, such as more than one laundry appliance. Control parameters are input to the controller over a communications link, which may be an optical communications link. The controller is automatically adaptable to particular ones of a plurality of different machines, for example laundry appliances in the form of a two-speed washer, a one-speed washer, an electric dryer and a gas dryer. The controller determines the particular appliance by applying signals to particular terminals of a connector connected to a machine to be interrogated. Other terminals are monitored to logically recognize the particular appliance. Thereafter, the control system implements functions appropriate to the particular appliance. An operation sequencing facility termed an 'internally restructurable control' is disclosed, a specific form of which is a testing facility termed 'internal test mode,' in which case the parameters include specifications of particular functional element states to be established in a sequence, as well as time durations for selected ones of the functional element states. In another facility, termed a 'diagnostic mode', the parameters indicate particular changes in controller output states.


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