The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 26, 1994

Filed:

Jan. 30, 1991
Applicant:
Inventors:

Hiroshi Yamamoto, Nagaokakyo, JP;

Katsuhiko Ichimura, Kobe, JP;

Kenji Nakamura, Ibaraki, JP;

Tomiyuki Maeda, Kyoto, JP;

Takahiro Tajima, Kyoto, JP;

Kiyoshi Wada, Mukaijima-Marumachi, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
436162 ; 73 6155 ; 2101983 ; 210658 ; 436161 ;
Abstract

Methods of conducting Thin Layer Chromatography (TLC) involving using a TLC plate having sample spots and including no support material, placing the TLC plate on a porous substrate, and allowing solvent to move upwardly from the porous substrate toward the TLC plate by capillary action to be vaporized from the surface of the TLC plate, thereby concentrating the sample spots developed in the thin layer on the surface of the TLC plate.


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