The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 1994
Filed:
May. 14, 1991
Mamoru Kaneko, Hachioji, JP;
Kuniaki Kami, Hachioji, JP;
Masakazu Gotanda, Kanagawa, JP;
Shuichi Takayam, Hachioji, JP;
Ichiro Nakamura, Kokubunji, JP;
Kazunari Nakamura, Hachioji, JP;
Eiichi Fuse, Hachioji, JP;
Susumu Takahashi, Kunitachi, JP;
Yoshihiro Kosaka, Hachioji, JP;
Hiromasa Suzuki, Akishima, JP;
Olympus Optical Co., Ltd., Tokyo, JP;
Abstract
A photo-pulse from a photo-pulse generating apparatus is branched, where one branch is radiated to an examined body and the reflected light reflected within the examined body is delayed in time in proportion to the depth from the surface of the examined body and is led to a time-analyzing reflected light measuring apparatus. In this measuring apparatus, the other branched reference photo-pulse or reference signal pulse is input as delayed by the time for which the photo-pulse reflected within the examined body returns and only the reflected light component synchronized with the entering timing of this reference light pulse is analyzed in the time and is detected. By varying the detection sensitivity of this measuring apparatus in response to the depth from the surface of the examined body, the interior can be observed.