The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 1994
Filed:
May. 04, 1992
Kenneth L Reifsnider, Blacksburg, VA (US);
Ahmad Razvan, Blacksburg, VA (US);
Mehran Elahi, Blacksburg, VA (US);
The Center for Innovative Technology, Herndon, VA (US);
Abstract
A conventional dynamic testing machine, such as an MTS (Material Test System) is modified to allow for a new method for dynamically monitoring fatigue damage in a specimen. Load and stroke signals are used to determine phase angle and gain frequency response parameters for a specimen as it is cyclically loaded. Although the cycles required for specimens to fatigue to failure varies greatly from specimen to specimen, the phase shift between the load and stroke signals as well as the gain of the stroke signal remains fairly constant from specimen to specimen. These characteristic parameters can be used to accurately determine the percent of life remaining and residual strength in other specimens.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile