The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 1994
Filed:
May. 01, 1992
Applicant:
Inventors:
Robert M Boysel, Plano, TX (US);
Jeffrey B Sampsell, Plano, TX (US);
Assignee:
Texas Instruments Incorporated, Dallas, TX (US);
Primary Examiner:
Int. Cl.
CPC ...
G01P / ;
U.S. Cl.
CPC ...
7351 / ; 377 23 ; 324162 ; 307361 ;
Abstract
Acceleration is measured using an array of micro-machined elements. The array is configured so each successive element is deflected by a higher acceleration. For each acceleration there will be a set of elements that is deflected. By determining the transition point between deflected and undeflected elements, the acceleration can be measured.
Boysel, Robert. (1994). Digital flexure beam accelerometer (U.S. Patent No. 5305640). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5305640
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile