The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 1994
Filed:
Jan. 11, 1993
H Cary Longest, Jr, Midlothian, VA (US);
Robert H Moffitt, Midlothian, VA (US);
W Randolph Sweeney, Richmond, VA (US);
Philip Morris Incorporated, New York, NY (US);
Abstract
A modular system and method using the system for the high speed high resolution inspection of printed webs are provided. Each module inspects one lane of a printed web for print defects. Each gray scale or bipolar gray scale gradient pixel value of a digitally converted input image is compared to the minimum and maximum threshold values of the image template by a real-time digital signal processor. The image template is created in a secondary non-real-time processor by producing a statistical representation of a number of input images. The image template is desensitized to longitudinal and transverse jitter of the printed web so that jitter is not identified by the system as a print defect. The user is signaled if actual print defects exist and the lanes in which the defects exist are identified.