The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 1994
Filed:
Sep. 18, 1991
Tadashi Gomibuchi, Tokyo, JP;
Toyo Glass Company Limited, Tokyo, JP;
Abstract
A method of and an apparatus for inspecting a bottle or the like by which the presence or absence of a defect, particularly a check, can be determined with a high degree of accuracy. Light is irradiated upon an inspection area of a rotating or moving object, and reflected light is photographed by a two-dimensional camera which includes solid-state image pickup elements. Picture element data for a first frame are fetched at a first point of time from the two-dimensional camera and stored into a memory, and then picture element data for a second frame are fetched at a second point of time after a fixed interval of time after the first point of time. Then, differences of the picture element data for the second frame from the picture element data for the first frame from the memory are taken and binary digitized with reference to predetermined brightness threshold level, and the differences which have one of two binary values are counted. The count number is compared with a predetermined number to determine the presence or absence of a defect in the object being inspected.