The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 1994
Filed:
Jun. 19, 1992
Applicant:
Inventors:
Otto Albrecht, Atsugi, JP;
Ken Eguchi, Yokohama, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356237 ;
Abstract
A method for detecting defects in a film structure of a thin film formed on a substrate by projecting a light flux in a direction precisely parallel or nearly parallel to the face of the substrate, separating a reflected light from the thin film and the substrate from a scattered light in a direction precisely perpendicular or nearly perpendicular to the face of the substrate and reading information only of the scattered light.