The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 1994
Filed:
Feb. 12, 1992
Norman C Ford, Jr, Amherst, MA (US);
Precision Detectors, Inc., Amherst, MA (US);
Abstract
A molecular characterization detector includes a scattering cell containing a sample for molecular characterization, a light source for directing a light beam through the cell so that the light beam is scattered by the sample, optical elements for selecting from the scattered light a measurement beam comprising light that is scattered by the sample from a predetermined portion of the cell in a predetermined range of angles relative to the optical axis, and a detector for detecting the measurement beam and providing an output electrical signal representative of the measurement beam. The detector typically selects light scattered from a central portion of the scattering cell at angles in the range of 14.degree. to 16.degree.. A single spherical lens is preferably utilized. As a result, interference from stray scattered light is minimized. A beam dump attenuates the light beam after it passes through the scattering cell. Additional detectors detect light scattered at 90.degree. to the light beam. The outputs of the detectors are processed to provide molecular characterization of the sample.