The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 12, 1994

Filed:

Jul. 17, 1992
Applicant:
Inventors:

William J Johnson, Flower Mound, TX (US);

Larry M Lachman, Irving, TX (US);

Guillermo Vega, Grapevine, TX (US);

Marvin L Williams, Lewisville, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03M / ;
U.S. Cl.
CPC ...
341123 ; 341155 ;
Abstract

Method of, and apparatus for, providing automatic detection of potential information loss due to undersampling and automatic detection of potential storage waste due to oversampling based on automatic determination of an analog signal's Nyquist rate. The invention acquires an analog signal, determines a maximum frequency of the analog signal and a corresponding Nyquist rate, and allows a user to select a sampling rate based on either the automatically determined Nyquist sampling rate, a user specified sampling rate, a sampling rate determined by a user specified bandwidth, or a sampling rate determined by user specified available space. The invention also informs a user when a loss of information may occur due to a sampling rate being less than the Nyquist rate. The invention also informs a user when a waste of storage may occur due to a sampling rate being greater than the Nyquist rate.


Find Patent Forward Citations

Johnson, William. (1994). Method of and apparatus for providing automatic determination of (U.S. Patent No. 5302950). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5302950

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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